Sensors Aging Differential power analysis DPA FDSOI MRAM Linearity Reverse engineering Temperature sensors Formal proof Asynchronous Security services Convolution Training OCaml Voltage Computational modeling Hardware Fault injection Image processing Magnetic tunneling ASIC Fault injection attack Formal methods Reliability Tunneling magnetoresistance Defect modeling Receivers Side-channel attack 3G mobile communication Spin transfer torque TRNG Logic gates GSM Side-Channel Analysis Side-channel attacks Lightweight cryptography Confusion coefficient Countermeasures PUF Field programmable gate arrays Application-specific VLSI designs Masking Countermeasure Process variation Neural networks SCA Coq RSA SoC Power demand Mutual Information Analysis MIA STT-MRAM Hardware security Reverse-engineering Side-channel attacks SCA Security Machine learning Field Programmable Gates Array FPGA Side-Channel Attacks Sécurité Loop PUF Authentication Internet of Things Writing Filtering Magnetic tunnel junction Signal processing algorithms Side-Channel Analysis SCA Elliptic curve cryptography Protocols Differential Power Analysis DPA Energy consumption Dual-rail with Precharge Logic DPL CPA Electromagnetic DRAM Side-channel analysis Randomness Resistance Estimation Circuit faults Switches Steadiness Power-constant logic Masking countermeasure Random access memory Robustness Transistors Variance-based Power Attack VPA AES Simulation Information leakage Security and privacy Routing Dynamic range CRT Cryptography FPGA Costs Intrusion detection